Markforged Mark Two

Markforged Mark Two

Markforged Mark Two The Markforged Mark Two is a high-end desktop material extrusion printer with a variety of easily adjustable parameters, making it well suited for everything from educational to industrial applications. It prints chopped carbon fiber reinforced...
TOF-SIMS

TOF-SIMS

Time-of-Flight Secondary Ion Mass Spectrometry Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly surface-sensitive analytical technique used to obtain elemental, isotopic and molecular information from the surface of solid materials. The surface of...
Helios NanoLab 600i DualBeam FIB/SEM

Helios NanoLab 600i DualBeam FIB/SEM

Helios NanoLab 600i DualBeam FIB/SEM The Helios NanoLab 600i is a versatile, high-performance DualBeam system containing a Ga+ focused ion beam (FIB) (500eV–30keV) together with a FEG extreme high-resolution scanning electron microscope (SEM) and Si-drift EDX detector...
Talos F200X Field Emission S/TEM

Talos F200X Field Emission S/TEM

Talos F200X Field Emission S/TEM The Talos F200X 200keV field emission scanning/transmission electron microscope is a versatile instrument for characterization of various materials. The X-FEG high-brightness electron source delivers high total current—up to five times...
Digital Image Correlation System

Digital Image Correlation System

Digital Image Correlation System All strain measurements in the lab are performed using digital image correlation (DIC). DIC is a noncontact optical strain measurement technique. Samples are speckled and a series of images is captured at a fixed frequency using...