Helios NanoLab 600i DualBeam FIB/SEM The Helios NanoLab 600i is a versatile, high-performance DualBeam system containing a Ga+ focused ion beam (FIB) (500eV–30keV) together with a FEG extreme high-resolution scanning electron microscope (SEM) and Si-drift EDX detector...
Talos F200X Field Emission S/TEM The Talos F200X 200keV field emission scanning/transmission electron microscope is a versatile instrument for characterization of various materials. The X-FEG high-brightness electron source delivers high total current—up to five times...
Digital Image Correlation System Digital image correlation (DIC) is a non-contact full-field optical strain measurement technique used in conjunction with various mechanical testing techniques. Samples are speckled and a series of images is captured at a fixed...
MTS 370.10 Uniaxial Servohydraulic Load Frame The MTS 370.10 provides high-fidelity uniaxial mechanical data on additively manufactured standard tensile test specimens for larger, structural materials. When combined with the composition- and orientation-related...
Mark 10 ESM1500 Electromechanical Load Frame The Mark 10 electromechanical load frame is a small, benchtop load frame that is easily configurable for tensile, compressive and bending testing of samples. It is well suited to characterize 3D-printed compression...
